Fix unused symbol warnings in tests.

And actually fix two real bugs...
This commit is contained in:
Milan Broz
2023-08-17 13:06:56 +02:00
parent 81574d0f14
commit 8c87958b3b
2 changed files with 8 additions and 4 deletions

View File

@@ -85,6 +85,10 @@ static int check_dlvsym(void *h, const char *symbol, const char *version)
}
log_dbg("OK\n");
#else
UNUSED(h);
UNUSED(symbol);
UNUSED(version);
#endif
return 0;
}

View File

@@ -520,7 +520,7 @@ static key_serial_t _kernel_key_by_segment_and_type(struct crypt_device *_cd, in
static key_serial_t _kernel_key_by_segment(struct crypt_device *_cd, int segment)
{
return _kernel_key_by_segment_and_type(cd, segment, "logon");
return _kernel_key_by_segment_and_type(_cd, segment, "logon");
}
static int _volume_key_in_keyring(struct crypt_device *_cd, int segment)
@@ -541,7 +541,7 @@ static int _drop_keyring_key_from_keyring_type(struct crypt_device *_cd, int seg
static int _drop_keyring_key(struct crypt_device *_cd, int segment)
{
return _drop_keyring_key_from_keyring_type(cd, segment, KEY_SPEC_THREAD_KEYRING, "logon");
return _drop_keyring_key_from_keyring_type(_cd, segment, KEY_SPEC_THREAD_KEYRING, "logon");
}
#endif
@@ -561,7 +561,7 @@ static int test_open(struct crypt_device *_cd __attribute__((unused)),
return 0;
}
static int test_open_pass(struct crypt_device *cd __attribute__((unused)),
static int test_open_pass(struct crypt_device *_cd __attribute__((unused)),
int token __attribute__((unused)),
char **buffer,
size_t *buffer_len,
@@ -575,7 +575,7 @@ static int test_open_pass(struct crypt_device *cd __attribute__((unused)),
return 0;
}
static int test_open_pass1(struct crypt_device *cd __attribute__((unused)),
static int test_open_pass1(struct crypt_device *_cd __attribute__((unused)),
int token __attribute__((unused)),
char **buffer,
size_t *buffer_len,